The Observation of Thick Specimens by High Voltage Electron Microscopy. Experiment with Molybdenite Films at 50-500 kV
- 1 May 1967
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 6 (5)
- https://doi.org/10.1143/jjap.6.557
Abstract
This study was designed to investigate how much the maximum thickness of crystalline specimens which was adequate for transmission observation could be increased with the accelerating voltage. Molybdenite films of 0.5–7.0 microns thickness were used for specimens. Dislocations in films of about 0.5, 1, 2 and 3 microns were found to be observable under routine irradiating conditions at 50, 100, 200 and 500 kV, respectively. With focused irradiation the thicknesses were about 30% larger, although the image quality was low. Dislocation images were generally obtained when the effect of the so-called anomalous transmission, which disappears for very thick specimens, was apparent in the corresponding diffraction pattern. The theoretical background for images of thick specimens is discussed. Reference is also made to preliminary results obtained with silicon. No conclusion has been drawn on the voltage dependence of the maximum thickness of specimens adequate for transmission observation.Keywords
This publication has 4 references indexed in Scilit:
- Electron Microscope Study on the Extinction and Absorption of 100 kV Electrons in Magnesium Oxide Single CrystalsJapanese Journal of Applied Physics, 1965
- Method for producing large Si films for preselected imperfection analysisJournal of Scientific Instruments, 1965
- HIGH-VOLTAGE ELECTRON MICROSCOPY*Journal of the Royal Microscopical Society, 1962
- Dislocation Networks and Moiré Patterns of MolybdeniteJournal of the Physics Society Japan, 1960