Transient Response Characteristics of Capacitive Potential Devices
- 1 September 1971
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Power Apparatus and Systems
- Vol. PAS-90 (5), 1989-2001
- https://doi.org/10.1109/TPAS.1971.292994
Abstract
Full voltage line to ground fault tests are performed on typical potential devices and the subsidence transient recorded. To show the worst case of residual voltage, faults are initiated while the primary voltage is passing through crest and zero.Keywords
This publication has 1 reference indexed in Scilit:
- A New Metering Accuracy Capacitive Potential DeviceIEEE Transactions on Power Apparatus and Systems, 1966