Quantitative ISS/XPS measurements on HDS catalysts
- 1 December 1984
- journal article
- research article
- Published by Wiley in Surface and Interface Analysis
- Vol. 6 (6), 295-301
- https://doi.org/10.1002/sia.740060610
Abstract
ISS and XPS spectra were obtained for hydrodesulfurization (HDS) catalysts made by two different preparative methods. Quantitative XPS measurements were used with ISS depth profiles to demonstrate that quantitative ISS data could be obtained despite the irregular structure of catalyst surfaces. Atomic compositions as a function of depth were then obtained by (1) use of ISS data directly or (2) by XPS formalism using a non‐constant depth distribution.This publication has 7 references indexed in Scilit:
- Effects of impregnation pH on the surface structure and hydrodesulfurization activity of Mo/Al2O3 catalystsJournal of Catalysis, 1983
- Low energy ion scattering study of Ni-Mo$z.sbnd;Al2O3 catalystsJournal of Catalysis, 1983
- Ion scattering spectrometry: A versatile technique for a variety of materialsSurface and Interface Analysis, 1981
- The surface structure of the oxidic precursor of CoMo/$gamma;-Al2O3 hydrodesulfurization catalystsJournal of Catalysis, 1980
- The quantitative analysis of surfaces by XPS: A reviewSurface and Interface Analysis, 1980
- Quantitative chemical analysis by ESCAJournal of Electron Spectroscopy and Related Phenomena, 1976
- Hartree-Slater subshell photoionization cross-sections at 1254 and 1487 eVJournal of Electron Spectroscopy and Related Phenomena, 1976