Characterization of the random array peak sidelobe
- 1 May 1979
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Antennas and Propagation
- Vol. 27 (3), 379-385
- https://doi.org/10.1109/tap.1979.1142097
Abstract
Upper bounds on the height of the peak sidelobe of the random array are derived using the theory of level crossings of a random process. Statistical properties of the random array beam pattern are presented and are used to calculate the expected number of up-crossings of a given level by the power pattern. Upper bounds on the peak sidelobe height are obtained using the expected number of up-crossings. The bounds are compared with computer simulation results.Keywords
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