Calculation of Wavelengths from Reflecting Echelon Patterns

Abstract

Wavelengths are calculated from measurements of reflecting echelon patterns by a simplified procedure which can be carried out conveniently, using a digital computer. By measuring to the position of the centre of the envelope, rather than to an arbitrary mirror image as hitherto, it is shown that envelope correction is automatically applied and a very simple correction for non-linearity of dispersion may be made where necessary.