Reactive ion etching of GaAs using a mixture of methane and hydrogen
- 1 January 1987
- journal article
- Published by Institution of Engineering and Technology (IET) in Electronics Letters
- Vol. 23 (16), 857-859
- https://doi.org/10.1049/el:19870606
Abstract
A dry etching technique which is capable of producing lowdamage, high-aspect-ratio structures on a nanometric scale in GaAs is described. The reactive ion etching employs a mixture of methane and hydrogen; details of the optimum conditions are given.Keywords
This publication has 1 reference indexed in Scilit:
- Electron Beam NanolithographySpringer Proceedings in Physics, 1986