Step-edge magnetoresistance in La0.7Ca0.3MnO3 films

Abstract
The magnetoresistance of step-edge structures in La0.7Ca0.3MnO3 films was investigated. Step-edge arrays with 200 steps of height 140–200 nm and step separation 20 μm along [110] were fabricated on LaAlO3 substrates by chemically assisted ion-beam etching. Thin La0.7Ca0.3MnO3 films were deposited on the structured substrates by pulsed-laser deposition. Measurements of the large low-field magnetoresistance, the dynamic conductance, and the anisotropic magnetoresistance lead to the proposal of a model of spin-polarized tunneling in a ferromagnet/spin-glass/ferromagnet geometry.