Characterization of MOVPE-grown InN layers on α-Al2O3 and GaAs substrates
- 1 June 1998
- journal article
- Published by Elsevier in Journal of Crystal Growth
- Vol. 189-190, 461-465
- https://doi.org/10.1016/s0022-0248(98)00331-5
Abstract
No abstract availableKeywords
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