X-Radiolysis Ion Yields and Electron Ranges in Liquid Xenon, Krypton, and Argon: Effect of Electric Field Strength

Abstract

X-Radiolysis ion yields were measured at electric fields between 1 and 60 kV/cm in argon at 87 °K, krypton at 148 °K, and xenon at 183 °K. The results were analyzed according to a theoretical model to obtain the total ion yields G_tot,the free ion yields at zero field strength G_fi⁰ and the most probable penetration ranges b of the secondary electrons in the liquids. The respective values were: Ar, 7.3, 2.9, 1330 Å; Kr, 13.0, 5.8, 880 Å; Xe, 13.7, 7.0, 720 Å. The total ionization yields in these substances are greater in the liquid than in the gas phase, probably due to smaller ionization potentials in the condensed phase (polarization energy effect). Field dependent electron mobilities are also reported.