AFM Study of Water Meniscus Formation between an AFM Tip and NaCl Substrate
- 7 May 2004
- journal article
- research article
- Published by American Chemical Society (ACS) in The Journal of Physical Chemistry B
- Vol. 108 (23), 7814-7819
- https://doi.org/10.1021/jp0401269
Abstract
No abstract availableKeywords
This publication has 24 references indexed in Scilit:
- Thiol Diffusion and the Role of Humidity in “Dip Pen Nanolithography”Physical Review Letters, 2002
- Investigation of Capillary Forces Using Atomic Force MicroscopyLangmuir, 2001
- Effect of Sample Topography on Adhesive Force in Atomic Force Spectroscopy Measurements in AirLangmuir, 2000
- Improved Imaging of Soft Materials with Modified AFM TipsLangmuir, 1999
- "Dip-Pen" NanolithographyScience, 1999
- Effect of Water on Lateral Force Microscopy in AirLangmuir, 1997
- Scanning Force Microscopies Can Image Patterned Self-Assembled MonolayersLangmuir, 1995
- Tip-surface capillary interactionsLangmuir, 1993
- Tip–sample forces in scanning probe microscopy in air and vacuumJournal of Vacuum Science & Technology A, 1992
- Coarse tip distance adjustment and positioner for a scanning tunneling microscopeReview of Scientific Instruments, 1989