A NEW SCANNING-REFLECTION X-RAY TOPOGRAPHIC METHOD
- 15 August 1965
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 7 (4), 101-102
- https://doi.org/10.1063/1.1754308
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
- Room Temperature Chemical Polishing of Ge and GaAsJournal of the Electrochemical Society, 1964
- Direct Observation of Imperfections in Semiconductor Crystals by Anomalous Transmission of X RaysJournal of Applied Physics, 1962
- Netzebenen-“interferometrie”Physics Letters, 1962
- Etch Pits in Gallium ArsenideJournal of Applied Physics, 1960
- Subgrain Structure in an Fe-Si Crystal as Seen by X-Ray Extinction ContrastJournal of Applied Physics, 1958
- Direct Observation of Individual Dislocations by X-Ray DiffractionJournal of Applied Physics, 1958