A New Type of X-Ray Pendellösung Fringes Observed in a Parallel-Sided Quartz Single Crystal
- 1 August 1965
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 4 (8), 619-620
- https://doi.org/10.1143/jjap.4.619
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- X-Ray Observations of Lattice Defects in Particular, Stacking Faults in the Neighbourhood of a Twin Boundary in Silicon Single CrystalsJournal of the Physics Society Japan, 1962
- Studies of Individual Dislocations in Crystals by X-Ray Diffraction MicroradiographyJournal of Applied Physics, 1959
- A study of pendellösung fringes in X-ray diffractionActa Crystallographica, 1959