Imaging at the picoscale
Open Access
- 31 December 2004
- journal article
- Published by Elsevier in Materials Today
- Vol. 7 (12), 42-48
- https://doi.org/10.1016/s1369-7021(04)00570-x
Abstract
No abstract availableThis publication has 25 references indexed in Scilit:
- Aberration correction for TEMMaterials Today, 2004
- “Indirect” High-Resolution Transmission Electron Microscopy: Aberration Measurement and Wavefunction ReconstructionMicroscopy and Microanalysis, 2004
- Prospects for realizing a sub-Å sub-eV resolution EFTEMUltramicroscopy, 1999
- Towards sub-Å electron beamsUltramicroscopy, 1999
- Maximum-likelihood method for focus-variation image reconstruction in high resolution transmission electron microscopyUltramicroscopy, 1996
- High-resolution electron holography of non-periodic structures at the example of a Σ = 13 grain boundary in goldUltramicroscopy, 1996
- Shadow images for in‐line holography in a STEM instrumentMicroscopy Research and Technique, 1995
- The theory of super-resolution electron microscopy via Wigner-distribution deconvolutionPhilosophical Transactions A, 1992
- A New Microscopic PrincipleNature, 1948
- ber einige Fehler von ElektronenlinsenThe European Physical Journal A, 1936