Correlated structural and optical properties of thin Eu oxide films
- 12 November 2002
- journal article
- Published by Elsevier in Materials Chemistry and Physics
- Vol. 80 (1), 186-190
- https://doi.org/10.1016/s0254-0584(02)00459-5
Abstract
No abstract availableThis publication has 10 references indexed in Scilit:
- Optical constants of evaporated gadolinium oxideJournal of Optics A: Pure and Applied Optics, 2001
- Double-layer anti-reflection coating using MgF2 and CeO2 films on a crystalline silicon substrateThin Solid Films, 2000
- Quantitative analysis of metals in soil using X-ray fluorescenceSpectrochimica Acta Part B: Atomic Spectroscopy, 2000
- Thickness dependence of the optical properties of sputter deposited Ti oxide filmsThin Solid Films, 2000
- Analysis of trace Co in synthetic diamonds using synchrotron radiation excited X-ray fluorescence analysisJournal of Crystal Growth, 2000
- Electrical Properties of Eu2O3 Thin FilmsPhysica Status Solidi (a), 1995
- Effect of UV exposure on optical properties of amorphous As_2S_3 thin filmsApplied Optics, 1990
- Matrix corrections for quantitative determination of trace elements in biological samples using energy‐dispersive X‐ray fluorescence spectrometryX-Ray Spectrometry, 1989
- Band-gap widening in heavily Sn-dopedPhysical Review B, 1984
- Dielectric properties of electron-beam-evaporated Nd2O3 thin filmsThin Solid Films, 1982