An analysis of the symmetries in electron microscope images of a sloping dislocation and its application as a method for dislocation characterization
- 16 April 1974
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 22 (2), 599-608
- https://doi.org/10.1002/pssa.2210220227
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Slip systems in NiAl single crystals at 300°K and 77°KPhilosophical Magazine, 1971
- The Computer Generation of Electron Microscope Pictures of DislocationsAustralian Journal of Physics, 1967
- Diffraction contrast of electron microscope images of crystal lattice defects - II. The development of a dynamical theoryProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1961