A new method to detect surface steps by specularly reflected fast ions
- 1 October 1988
- journal article
- Published by Elsevier in Surface Science
- Vol. 204 (1-2), 213-222
- https://doi.org/10.1016/0039-6028(88)90277-4
Abstract
No abstract availableKeywords
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- Energy loss of MeV protons specularly reflected at a clean (001) surface of SnTe crystalSurface Science, 1987
- Determination of the step distance on a crystal surface by surface channelingSurface Science, 1985
- Comments on “RED intensity oscillations during MBE of GaAs”Surface Science, 1981
- Theorie der Streuung schneller geladener Teilchen I. Einzelstreuung am abgeschirmten Coulomb-FeldZeitschrift für Naturforschung A, 1947