Study of α-Sexithienyl Thin Film by Polarized Near Edge X-ray Absorption Fine Structure
- 1 May 1996
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 35 (5R)
- https://doi.org/10.1143/jjap.35.2822
Abstract
An ultrathin α-Sexithienyl (6T) film prepared by an organic molecular beam deposition method on a silver (Ag) film was studied by polarized near edge X-ray absorption fine structure (NEXAFS) spectroscopy using synchrotron radiation and IR-reflection absorption spectroscopy. The carbon K-edge NEXAFS spectrum of 6T was similar to those reported for poly-(3-methylthienylene) and thiophene. Polarized NEXAFS spectra of 6T exhibit strong angular dependence of 1 s→π* resonance intensity, showing that 6T molecules in the film deposited on the Ag film at room temperature had a highly oriented structure. To obtain quantitative information about molecular orientation, this dependence is analyzed by a comparison with theoretical calculation, indicating that the molecular axis is inclined by about 71° to the substrate surface. This angle is almost the same as that reported for 6T film on quartz.Keywords
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