Discriminative Learning of Markov Random Fields for Segmentation of 3D Scan Data
- 27 July 2005
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- Vol. 2 (10636919), 169-176
- https://doi.org/10.1109/cvpr.2005.133
Abstract
We address the problem of segmenting 3D scan data into objects or object classes. Our segmentation framework is based on a subclass of Markov random fields (MRFs) which support efficient graph-cut inference. The MRF models incorporate a large set of diverse features and enforce the preference that adjacent scan points have the same classification label. We use a recently proposed maximum-margin framework to discriminatively train the model from a set of labeled scans; as a result we automatically learn the relative importance of the features for the segmentation task. Performing graph-cut inference in the trained MRF can then be used to segment new scenes very efficiently. We test our approach on three large-scale datasets produced by different kinds of 3D sensors, showing its applicability to both outdoor and indoor environments containing diverse objects.Keywords
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