The Relationship Between Orientation, Grain Size, and Brightness in Nickel Electrodeposits

Abstract

A large number of eleetrodeposited nickel panels, deposited under varied conditions, were examined by improved x‐fraction techniques. Orientation and grain size were evaluated in order to determine whether or not any correlation exists between these measurable characteristics and the fundamental optical property of brightness. The x‐ray grain sizes of matte, semibright, and bright deposits were found to be of the same order of magnitude, and, furthermore, no correlation was found to exist between orientation of the crystals and brightness.