Electrical and structural assessment of CdTe and CdMnTe layers grown by MBE on InSb substrates
- 1 April 1990
- journal article
- Published by Elsevier in Journal of Crystal Growth
- Vol. 101 (1-4), 157-161
- https://doi.org/10.1016/0022-0248(90)90956-l
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
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- High-resolution x-ray diffraction studies of InGaAs(P)/InP superlattices grown by gas-source molecular-beam epitaxyJournal of Applied Physics, 1987
- Photoassisted Mbe: A New Approach To Substitutional DopingPublished by SPIE-Intl Soc Optical Eng ,1987
- An MBE route towards CdTe/InSb superlatticesJournal of Vacuum Science & Technology B, 1985
- Structure and coherence of NbAl multilayer filmsJournal of Applied Physics, 1983
- Molecular Beam Epitaxy of In-Doped CdTeJapanese Journal of Applied Physics, 1982