High-sensitivity reflection-transmission moire deflectometer
- 15 January 1988
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 27 (2), 351-353
- https://doi.org/10.1364/ao.27.000351
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.This publication has 5 references indexed in Scilit:
- Moire Deflectometry: A Ray Deflection Approach To Optical TestingOptical Engineering, 1985
- Phase object microscopy using moire deflectometryApplied Optics, 1985
- Absorption coefficient of Dupont Teflon FEP in the 20–130 wave-number rangeApplied Optics, 1985
- Reflective surface analysis using moiré deflectometryApplied Optics, 1981
- Noncoherent method for mapping phase objectsOptics Letters, 1980