Röntgenpräzisionsuntersuchungen an legierten Germanium-Indium-pn-Übergängen
- 1 February 1958
- journal article
- research article
- Published by Springer Nature in The European Physical Journal A
- Vol. 152 (1), 26-33
- https://doi.org/10.1007/bf01322003
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Präzisionsmessung der Gitterkonstante an Germanium-Einkristallen nach Kossel und van BergenThe European Physical Journal A, 1958
- New advances in the junction TransistorPublished by Springer Nature ,1954
- Distribution of Solute in Crystals Grown from the Melt. Part II. ExperimentalThe Journal of Chemical Physics, 1953
- Electrical Properties of Pure Silicon and Silicon Alloys Containing Boron and PhosphorusPhysical Review B, 1949