Chemical Bonding Effects in the OxygenX-Ray Emission Bands of Silica
- 15 December 1973
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 8 (12), 5977-5998
- https://doi.org/10.1103/physrevb.8.5977
Abstract
Self-consistent-field (SCF) atomic and molecular orbitals and energy levels for O, SiO, and collinear O are used to interpret the oxygen soft-x-ray emission spectrum of silica. The O and O orbitals are calculated in both the frozen-orbital (FO) and relaxed-orbital (RO) approximations. The results are used to calculate the emission-line energies and oscillator strengths for the oxygen spectrum of each species. The calculated separation between the and emission lines of collinear O in both the RO approximation (6.9 eV) and the FO approximation (6 eV) are somewhat larger than the observed separation between the principal emission peak and low-energy satellite in silica (5 eV), but it is shown that the bending of the Si-O-Si bond in silica will reduce the separation. The calculated position of the principal line for O (525.7 eV in the RO approximation) is in good agreement with the principal peak observed in silica (526 eV). The and atomic orbitals of silicon are found to be strongly modified from their free-atom shape in both SiO and O; enough to make an order-of-magnitude difference between oscillator strengths calculated in the SCF and linear-combination-of-atomic-orbitals approximations. The modifications of the oxygen valence orbitals are relatively small. The oxygen hybridization is quite small. The atomic population of the level is 88% , 2% , 4% and 5% . The hybridization is also small: a maximum of 5% in the level and 1% in the level. Crossover transitions in a literal sense are negligible. The line in the silicon spectrum of SiO, for example, [the transition], is almost entirely a vertical transition which comes from the small admixture. An atomic population analysis gives ionicities of and
Keywords
This publication has 45 references indexed in Scilit:
- Determination of optical interband transitions in crystalline quartz from X‐ray spectroscopical dataPhysica Status Solidi (b), 1972
- Ab initio calculations on the silicate ion, orthosilicic acid and their L2,3 X-ray spectraJournal of the Chemical Society, Faraday Transactions 2: Molecular and Chemical Physics, 1972
- Photoemission Measurements of the Valence Levels of Amorphous SiPhysical Review Letters, 1971
- Bonding and Delocalization Effects in SiPolymorphsPhysical Review Letters, 1971
- Electronic structure of defect centers in SiO2Journal of Physics and Chemistry of Solids, 1971
- The origin and intensities of low energy satellite lines in X-ray emission spectra: a molecular orbital interpretationJournal of Physics C: Solid State Physics, 1970
- Temperature dependence of the short wavelength transmittance limit of vacuum ultraviolet window materials—II theoretical, including interpretations for U.V. spectra of SiO2, GeO2, and Al2O3Journal of Physics and Chemistry of Solids, 1970
- The structure of vitreous silicaJournal of Applied Crystallography, 1969
- Vanadium LII, III X-Ray Emission and Absorption Spectra from Metal, Oxides, Nitride, Carbide, and BorideJournal of Applied Physics, 1969
- Effect of Chemical Combination on the X-Ray K Emission Spectra of Oxygen and FluorineThe Journal of Chemical Physics, 1965