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Real time monitoring of the growth of transparent thin films by spectroscopic ellipsometry
Home
Publications
Real time monitoring of the growth of transparent thin films by spectroscopic ellipsometry
Real time monitoring of the growth of transparent thin films by spectroscopic ellipsometry
MK
M. Kildemo
M. Kildemo
BD
B. Drévillon
B. Drévillon
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14 August 1995
journal article
Published by
AIP Publishing
in
Applied Physics Letters
Vol. 67
(7)
,
918-920
https://doi.org/10.1063/1.114694
Abstract
No abstract available
Keywords
THIN FILM
LEAST SQUARE
REAL TIME SYSTEMS
REFRACTIVE INDEX
PHASE MODULATION
Cited by 16 articles