X-ray photoelectron diffraction study of thin Cu films grown on clean Ru(0001) and O-precovered Ru(0001)
- 1 February 1999
- journal article
- Published by Elsevier in Surface Science
- Vol. 421 (3), 205-236
- https://doi.org/10.1016/s0039-6028(98)00741-9
Abstract
No abstract availableThis publication has 58 references indexed in Scilit:
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