Stimulated migration of point defects due to electron bombardment in the electron microscope, and its possible effect on their clustering
- 1 October 1964
- journal article
- other
- Published by Taylor & Francis in Philosophical Magazine
- Vol. 10 (106), 723-726
- https://doi.org/10.1080/14786436408228490
Abstract
In recent years high resolution electron-microscopy has become a popular technique for studying point defect agglomerates produced in solids by irradiation or quenching (for a comprehensive review see Amelinckx 1963).Keywords
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