Abstract
The properties of three Ge(Li) detectors as γ‐ray spectrometers were measured over the temperature range 5.0 to 170°K. These detectors, selected to show a range of charge‐trapping effects, all exhibited predominantly electron trapping, and optimum resolution occurred between 20 and 30°K where electron‐trapping effects were a minimum. As the temperature was reduced it was possible to increase the operating voltage, giving some improvement in resolution. Below 20°K the γ‐ray resolution rapidly deteriorated due to the appearance of a slow‐rising component (up to 20 μsec) in the preamplifier pulses.