Abstract
Using insulated field plates, we have observed band‐to‐band tunneling and impurity‐to‐band tunneling in ion‐implanted n+‐on‐p Hg1−xCdxTe photodiodes. The latter process results in a field‐plate‐voltage controlled negative resistance region in the forward biased IV characteristic. The peak and valley voltages for this excess current process are greater than those observed in Esaki type tunnel diodes.