Ex situ variable angle spectroscopic ellipsometry studies of electron cyclotron resonance etching of Hg1−xCdxTe
- 4 October 1993
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 233 (1-2), 46-49
- https://doi.org/10.1016/0040-6090(93)90058-w
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
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- Microstructure characterization by angle-resolved scatter and comparison to measurements made by other techniquesApplied Optics, 1992
- Comparison Of Techniques For Measuring The Roughness Of Optical SurfacesOptical Engineering, 1985
- Investigation of effective-medium models of microscopic surface roughness by spectroscopic ellipsometryPhysical Review B, 1979