Submicrometer modification of polymer surfaces with a surface force microscope

Abstract

We have used the sharp tip of a surface force microscope to make modifications with submicrometer dimensions on polymer surfaces. In this letter we show three examples: scribed grooves with widths less than 120 nm, raised areas with heights up to 1 nm above the original surface, and pits with depths of 6 nm. We also discuss possible sources of contrast in surface force microscope images that are not due to height variations in the surface topography. Because the surface force microscope can be used for both conducting and nonconducting materials, it has an advantage over the higher resolution scanning tunneling microscope.