Proximity Effects of Interconnection Lines in High Speed Integrated Logic Circuits
- 1 October 2006
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 369-373
- https://doi.org/10.1109/euma.1983.333255
Abstract
The proximity and coupling effects between interconnection lines in V.S.L.I. circuits are studied by evaluating the power in the circuit. The coupling and propagation matrices and the exact current distribution in the conductors are established. The results of computation show that the losses and the dispersions in the lines are increased by proximity effects.Keywords
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