XPS and IR (ATR) analysis of Pd oxide films obtained by electrochemical methods
- 1 May 1988
- journal article
- research article
- Published by Wiley in Surface and Interface Analysis
- Vol. 11 (8), 447-449
- https://doi.org/10.1002/sia.740110807
Abstract
No abstract availableKeywords
This publication has 9 references indexed in Scilit:
- An electrochemical investigation of monolayer and multilayer oxide films on palladium in aqueous mediaJournal of Electroanalytical Chemistry and Interfacial Electrochemistry, 1985
- Fast faradaic processes observed during the potentiodynamic polarization of polycrystalline palladium in acid electrolyteJournal of Electroanalytical Chemistry and Interfacial Electrochemistry, 1984
- XPS investigation of surface oxidation layers on a platinum electrode in alkaline solutionElectrochimica Acta, 1984
- XPS study of the electrochemical surface oxidation of Platinum in N H2SO4 acid electrolyteElectrochimica Acta, 1984
- An X-ray photoelectron spectroscopic study of electrocatalytic activity of platinum group metals for chlorine evolutionElectrochimica Acta, 1983
- Palladium + tin oxide catalyst for electrooxidation of methanol and its chemical characterization by x-ray photoelectron spectroscopyJournal of Electroanalytical Chemistry and Interfacial Electrochemistry, 1982
- The surface film formed on amorphous Pd-Ti-P alloy by anodic polarization in 2 m NaCl solutionElectrochimica Acta, 1980
- An ESCA study of the termination of the passivation of elemental metalsThe Journal of Physical Chemistry, 1978
- X-ray photoelectron spectroscopic studies of palladium oxides and the palladium-oxygen electrodeAnalytical Chemistry, 1974