The fundamental parameter method applied to X-ray fluorescence analysis with synchrotron radiation
- 1 May 1992
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 68 (1-4), 125-132
- https://doi.org/10.1016/0168-583x(92)96063-5
Abstract
No abstract availableThis publication has 8 references indexed in Scilit:
- Characterisation of a source of x-ray synchrotron radiationNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1991
- State-of-the-art efficiency determination for a Si(Li) X-ray detector in the 3–40 keV energy rangeNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1986
- A method for the quantitative determination of synchrotron radiation X-ray spectra for absolute XRF trace element detectionNuclear Instruments and Methods in Physics Research, 1983
- Experimental set-up for X-ray absorption spectroscopy at DESYNuclear Instruments and Methods, 1980
- Phase space analysis applied to x-ray opticsNuclear Instruments and Methods, 1978
- Quantitative X-Ray Fluorescent Analysis Using Fundamental ParametersAdvances in X-ray Analysis, 1975
- X-Ray Fluorescence Yields, Auger, and Coster-Kronig Transition ProbabilitiesReviews of Modern Physics, 1972
- On the Classical Radiation of Accelerated ElectronsPhysical Review B, 1949