Nonlinear Characterization of Multiple Carrier Power Amplifiers
- 1 November 2000
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableThis publication has 1 reference indexed in Scilit:
- Envelope Distortion Models with Memory Improve the Prediction of Spectral Regrowth for Some RF AmplifiersPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1996