Diffusion lengths in amphoteric GaAs heteroface solar cells

Abstract
Minority‐carrier diffusion lengths in amphoteric GaAs : Si were investigated. Electron and hole diffusion lengths in p and n type respectively were determined to be Ln=13 μm and Lp=7 μm. Preliminary efficiency measurements on heteroface structures based on amphoteric GaAs : Si pn junctions indicated that these devices should make excellent solar cells.

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