The nanometer age: Challenge and chance
- 1 February 1995
- journal article
- Published by Elsevier in Microelectronic Engineering
- Vol. 27 (1-4), 3-15
- https://doi.org/10.1016/0167-9317(94)00045-v
Abstract
No abstract availableThis publication has 48 references indexed in Scilit:
- Magnetic circular dichroism in cobalt films observed with scanning-tunneling-microscope-excited fluorescencePhysical Review Letters, 1994
- Laser-frequency mixing in a scanning force microscope and its application to detect local conductivityJournal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 1994
- Cooperative self-assembly of Au atoms andon Au(110) surfacesPhysical Review Letters, 1994
- Hot electron scattering processes in metal films and at metal-semiconductor interfacesPhysical Review Letters, 1993
- True Atomic Resolution by Atomic Force Microscopy Through Repulsive and Attractive ForcesScience, 1993
- Novel transport effects in high-bias ballistic-electron-emission spectroscopyPhysical Review Letters, 1993
- Atomic-scale manipulation in air with the scanning tunneling microscopeApplied Physics Letters, 1992
- Observation of single charge carriers by force microscopyPhysical Review Letters, 1990
- Understanding magnetic force microscopyZeitschrift für Physik B Condensed Matter, 1990
- Optical interactions in the junction of a scanning tunneling microscopePhysical Review Letters, 1990