Instrument for Observation of Magnetization Vector Position in Thin Magnetic Films

Abstract

An instrument is described which relates magnetization vector position in a thin film to rf mixing behavior under a crossed‐wire probe. The high sensitivity possible with tuned rf amplification permits nondestructive observation of small areas of the film and affords an angular resolution on the order of one‐tenth degree. Accurate location of the film easy axis and direct indication of magnetization vector rotation under the influence of a static field are obtained.