Characterization of silicon nitride single crystals and polycrystalline reaction sintered silicon nitride by microhardness measurements
- 1 December 1980
- journal article
- Published by Springer Nature in Journal of Materials Science
- Vol. 15 (12), 3051-3056
- https://doi.org/10.1007/bf00550375
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Effect of BaF2 on the Nitridation of Commercial SiliconJournal of the American Ceramic Society, 1980
- A mechanism for the nitridation of Fe-contaminated siliconJournal of Materials Science, 1978
- Structure, formation mechanisms and kinetics of reaction-bonded silicon nitrideJournal of Materials Science, 1976