Modification of Silicon Nitride Tips with Trichlorosilane Self-Assembled Monolayers (SAMs) for Chemical Force Microscopy
- 1 August 1997
- journal article
- research article
- Published by American Chemical Society (ACS) in Langmuir
- Vol. 13 (16), 4323-4332
- https://doi.org/10.1021/la9609783
Abstract
No abstract availableKeywords
This publication has 31 references indexed in Scilit:
- Characterization of Partial Monolayers on Glass Using Friction Force MicroscopyLangmuir, 1996
- Self-assembled monolayer film for enhanced imaging of rough surfaces with atomic force microscopyJournal of Applied Physics, 1994
- An Intrinsic Relationship between Molecular Structure in Self-Assembled n-Alkylsiloxane Monolayers and Deposition TemperatureThe Journal of Physical Chemistry, 1994
- Packing of Hydrocarbon and Perfluorocarbon Chains Planted on Oxidized Surface of Silicon As Studied by Ellipsometry and Atomic Force MicroscopyLangmuir, 1994
- Long-Range Attractive Force Between Hydrophobic Surfaces Observed by Atomic Force MicroscopyScience, 1993
- Discriminating Molecular Length of Chemically Adsorbed Molecules Using an Atomic Force Microscope Having a Tip Covered with Sensor Molecules (An Atomic Force Microscope Having Chemical Sensing Function)Japanese Journal of Applied Physics, 1993
- Effect of hydrocarbon chain length on arrangement of chemically adsorbed monolayersLangmuir, 1992
- Tip–sample forces in scanning probe microscopy in air and vacuumJournal of Vacuum Science & Technology A, 1992
- Measuring the nanomechanical properties and surface forces of materials using an atomic force microscopeJournal of Vacuum Science & Technology A, 1989
- Structure and reactivity of alkylsiloxane monolayers formed by reaction of alkyltrichlorosilanes on silicon substratesLangmuir, 1989