Average and super structure ofβeucryptite (LiAlSiO4) Part II. Superstructure
- 1 July 1972
- journal article
- research article
- Published by Walter de Gruyter GmbH in Zeitschrift für Kristallographie
- Vol. 135 (3-4), 175-198
- https://doi.org/10.1524/zkri.1972.135.3-4.175
Abstract
The superstructure of β eucryptite shows an alternating sequence of Si and Al layers. For a Si-Al ratio of 1:1 only in this arrangement each AlO4 or SiO4 tetrahedron can be surrounded by four SiO4 or AlO4 tetrahedra, respectively. The Li atoms also have an ordered distribution. The following mean values of bond distances were obtained: Si–O = 1.606 Å, Al–O = 1.733 Å, Li–O = 2.02 Å. The shortest O–O distance of SiO4 tetrahedra is 2.48 Å. For refinements with anisotropic temperature factors the final R values of the superstructure reflections and of all reflections were 0.088 and 0.057, respectively.Keywords
This publication has 10 references indexed in Scilit:
- A refinement of the structure of anorthite*,1Zeitschrift für Kristallographie, 1971
- Untergruppen der RaumgruppenCrystal Research and Technology, 1966
- Extinction in quartzActa Crystallographica, 1965
- Crystal structure of an authigenic maximum microclineZeitschrift für Kristallographie, 1964
- The redetermination and refinement of the crystal structure of rhodonite, (Mn,Ca)SiO3Zeitschrift für Kristallographie, 1963
- The structure of anorthite, CaAl2Si2O8. II. Description and discussionActa Crystallographica, 1962
- Untersuchungen über die Grösse des Si–O–Si-ValenzwinkelsActa Crystallographica, 1961
- Untersuchungen an Schichtsilikaten des FormeltypsAm(Si2O5)n. I. Die Kristallstruktur der Zimmertemperaturform des Li2Si2O5Acta Crystallographica, 1961
- Systematik und Deutung von Pseudo-AuswahlregelnZeitschrift für Kristallographie, 1959
- Synthese und Kristallstruktur des Eukryptits, LiAlSiO4Acta Crystallographica, 1948