Stress Annealing in Copper Films
- 1 February 1956
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 27 (2), 193
- https://doi.org/10.1063/1.1722337
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- The Cause of Stress in Evaporated Metal FilmsProceedings of the Physical Society. Section B, 1954
- Lattice defects and the electrical resistivity of metalsAdvances in Physics, 1954
- The Origin of Stress in Metal Layers Condensed from the Vapour in High VacuumProceedings of the Physical Society. Section B, 1953
- Evidence for Collapse of Lattice Vacancy Aggregates to Form Dislocation RingsJournal of Applied Physics, 1953
- Thin Films of Ferromagnetic MaterialsReviews of Modern Physics, 1953
- Recovery of the Resistivity of Metals after Cold-WorkingNature, 1952