A Reflectance Analog Computer for the Determination of Thin Film Optical Properties
- 1 July 1973
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 44 (7), 914-915
- https://doi.org/10.1063/1.1686281
Abstract
Apparatus is described which allows the continuous automatic recording of the intensity of linearly polarized light reflected from a growing thin film. From these data the optical properties of the thin film can be determined.Keywords
This publication has 1 reference indexed in Scilit:
- Linear circuit applications of operational amplifiersIEEE Spectrum, 1971