Structure determination of Cu(100)-p(2×2)-S using x-ray diffraction

Abstract

The role of substrate reconstruction in the Cu(100)-(2×2)-S system has been investigated using x-ray diffraction. It is found that the first-layer Cu atoms are laterally displaced away from the S atoms by 0.03±0.01 Å. This result resolves a recent controversy between a low-energy electron-diffraction study and an angle-resolved-photoemission extended-fine-structure analysis in favor of the electron-diffraction result.