An XPS analysis of different SiO2 modifications employing a C 1s as well as an Au 4f7/2 static charge reference
- 1 January 1992
- journal article
- research article
- Published by Wiley in Surface and Interface Analysis
- Vol. 18 (1), 59-64
- https://doi.org/10.1002/sia.740180110
Abstract
No abstract availableKeywords
This publication has 23 references indexed in Scilit:
- Surface modifications during Y zeolite dealuminationSurface and Interface Analysis, 1990
- A method for depositing well defined metal particles onto a solid sample suitable for static charge referencing in X-ray photoelectron spectroscopyJournal of Electron Spectroscopy and Related Phenomena, 1989
- The auger parameter, its utility and advantages: a reviewJournal of Electron Spectroscopy and Related Phenomena, 1988
- Models for the oxidation of siliconCritical Reviews in Solid State and Materials Sciences, 1988
- Investigation of internal silanol groups as structural defects in ZSM-5-type zeolitesJournal of the Chemical Society, Faraday Transactions 1: Physical Chemistry in Condensed Phases, 1987
- XPS: Energy calibration of electron spectrometers. 1—An absolute, traceable energy calibration and the provision of atomic reference line energiesSurface and Interface Analysis, 1984
- An XPS study of Si as it occurs in adsorbents, catalysts, and thin filmsApplications of Surface Science, 1983
- An ESCA study of the termination of the passivation of elemental metalsThe Journal of Physical Chemistry, 1978
- Silicalite, a new hydrophobic crystalline silica molecular sieveNature, 1978
- Extinction in quartzActa Crystallographica, 1965