An electrostatic-magnetic alinement section for the electron microscope
- 1 October 1958
- journal article
- research article
- Published by IOP Publishing in Journal of Scientific Instruments
- Vol. 35 (10), 357-359
- https://doi.org/10.1088/0950-7671/35/10/303
Abstract
A compact electron beam shift and tilt system, using electric and magnetic fields in place of the normal mechanical system, is described. This improves mechanical stability and permits reflexion electron microscopy up to angles of beam tilt of 20°.This publication has 1 reference indexed in Scilit:
- Magnetic deflexion of electron beams without astigmatismJournal of Scientific Instruments, 1958