A new method for measuring refractive index and thickness of liquid and deposited solid thin films
- 31 March 1975
- journal article
- Published by Elsevier in Optics Communications
- Vol. 13 (3), 327-329
- https://doi.org/10.1016/0030-4018(75)90112-1
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- Numerical solution of the mode-equation of planar dielectric waveguides to determine their refractive index and thickness by means of a prism-film couplerOptics Communications, 1973
- Measurement of Thin Film Parameters with a Prism CouplerApplied Optics, 1973
- A high efficiency thin grating coupler for integrated opticsOptics Communications, 1973
- Theory of the Prism–Film Coupler by Plane-Wave AnalysisJournal of the Optical Society of America, 1970
- Holographic Thin Film CouplersBell System Technical Journal, 1970
- MODES OF PROPAGATING LIGHT WAVES IN THIN DEPOSITED SEMICONDUCTOR FILMSApplied Physics Letters, 1969