Small Angle and Very-Small Angle X-Ray Scattering from Amorphous Pd80Si20 before and after Cold Work
- 1 April 1981
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 20 (4), L271
- https://doi.org/10.1143/jjap.20.l271
Abstract
Structure of amorphous pd80Si20 and its change after 20% cold forging are examined by means of small angle scattering (SAS) and very-small angle scattering (VSAS) of X-rays. Before the cold work a hump is observed in SAS corresponding to a distance of 40 Å, and a broadening of transmitted beam is observed in the very-small angle region. The latter is shown not to be due to the refraction but really to the scattering of X-rays. The VSAS corresponds to the radius of gyration of 105 A. After cold work the SAS intensities diminish and the VSAS disappears.Keywords
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