High-accuracy distance and inclination measurement using slit-ray projection method
- 1 January 1987
- journal article
- research article
- Published by Wiley in Systems and Computers in Japan
- Vol. 18 (12), 1-10
- https://doi.org/10.1002/scj.4690181201
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Real-Time Range Measurement Device for Three-Dimensional Object RecognitionIEEE Transactions on Pattern Analysis and Machine Intelligence, 1986
- Object Recognition Using Three-Dimensional InformationIEEE Transactions on Pattern Analysis and Machine Intelligence, 1983