Capacitance measurements as a new tool to investigate the electronic states of dislocations in semiconductors
- 16 June 1976
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 35 (2), 451-457
- https://doi.org/10.1002/pssa.2210350205
Abstract
No abstract availableKeywords
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- Preparation and analysis of germanium slices having prevalence of either screw or edge dislocationsIl Nuovo Cimento B (1971-1996), 1967
- Temperature dependence of the energy gap in semiconductorsPhysica, 1967
- Restoration of Resistivity and Lifetime in Heat Treated GermaniumJournal of Applied Physics, 1955