Scanning force microscopy using a simple low-noise interferometer
- 31 July 1989
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 55 (5), 439-441
- https://doi.org/10.1063/1.101891
Abstract
A force microscope is described that can be used for high-resolution surface profiling and for observing magnetic domains. The microscope uses a Michelson interferometer to sense the vibration of a cantilever. The interferometer contains some straightforward processing to eliminate laser intensity noise. Some measuring results are presented that illustrate the performance of the microscope.Keywords
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